Material Technology
Equipment Database
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FRT Profilometri
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Description
The MicroProf works as an optical profilometer (2D) as well as an imaging measuring instrument (3D) by means of a scanning process. Roughness and waviness can be determined in 2D or 3D according to DIN EN ISO standards. With the optical sensor FRT CWL, the sample is illuminated by focused white light. Evaluating the reflected light, the sensor investigates the structures on the sample at a working distance of 4 mm.
Basic Information
| Purchase year | 2006 |
| Weight [kg] | 120 |
| Power [kW] | 0.2 |
| Software | FRT Mark III Version 3.8 |
Accessories
