Material Technology
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SEM-EDS
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Description
Hitachi S-4800 Ultra-High Resolution Scanning Electron Microscope
High-Resolution Field-Emission scanning electron microscope (SEM), having a resolution of 1 nm. It is equipped with energy dispersive x-ray analysis (EDS) for determining chemical composition, BSE detector and STEM imaging equipment. Ideal for ultra-high resolution applications such as semiconductor, material studies and nanotechnology.
High-Resolution Field-Emission scanning electron microscope (SEM), having a resolution of 1 nm. It is equipped with energy dispersive x-ray analysis (EDS) for determining chemical composition, BSE detector and STEM imaging equipment. Ideal for ultra-high resolution applications such as semiconductor, material studies and nanotechnology.
Basic Information
| Purchase year | 2006 |
| Weight [kg] | 1000 |
| Power [kW] | 6.4 |
Accessories
