Material Technology
Equipment Database
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XRF Analyzer X-Strada Desktop
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Categories
Description
An XRF analyzer for measurement of coating thickness and material composition.
Measure the thickness and/or composition of plating, coatings, and films, containing elements from Ti through U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously
Measure the thickness and/or composition of plating, coatings, and films, containing elements from Ti through U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously
Basic Information
| Purchase year | 2007 |
| Weight [kg] | 50 |
| Power [kW] | 0.2 |
Accessories
